{"id":1965,"date":"2017-01-25T12:25:12","date_gmt":"2017-01-25T18:25:12","guid":{"rendered":"https:\/\/www.eng.ufl.edu\/nimet\/?page_id=1965"},"modified":"2026-04-14T14:06:37","modified_gmt":"2026-04-14T18:06:37","slug":"brent-gila","status":"publish","type":"page","link":"https:\/\/www.eng.ufl.edu\/nimet\/people-2\/coe\/brent-gila\/","title":{"rendered":"Brent Gila"},"content":{"rendered":"<div class=\"wp-block-image\">\n<figure class=\"alignleft\"><img loading=\"lazy\" decoding=\"async\" width=\"130\" height=\"200\" src=\"https:\/\/www.eng.ufl.edu\/nimet\/wp-content\/uploads\/sites\/227\/2017\/01\/Brent-Gila.jpg\" alt=\"\" class=\"wp-image-1967\"\/><\/figure>\n<\/div>\n\n\n<p><strong>Director of Nanoscale Research Facility and Assistant Research Scientist, Research Service Centers<br><\/strong>PhD, University of Florida<\/p>\n\n\n\n<p><a href=\"https:\/\/rsc.aux.eng.ufl.edu\/\">Research Service Centers<\/a> | <a href=\"https:\/\/www.eng.ufl.edu\/\">Herbert Wertheim College of Engineering<\/a><\/p>\n\n\n\n<div style=\"height:10px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<p><strong>Research Interests:<\/strong> Semiconductor and dielectric growth and characterization, graphene, solid state sensors, focused ion beam processing.<\/p>\n\n\n\n<p><strong>Publications:<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list ul1\">\n<li><a href=\"https:\/\/scholar.google.com\/citations?user=YJe2rsUAAAAJ&amp;hl=en\" target=\"_blank\" rel=\"noopener noreferrer\">Brent Gila&#8217;s Publications<\/a><\/li>\n<\/ul>\n\n\n\n<p><strong>Homepage:<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><a href=\"http:\/\/www.mse.ufl.edu\/people\/mse-faculty\/brent-gila\/\" target=\"_blank\" rel=\"noopener noreferrer\">Brent Gila&#8217;s\u00a0Homepage<\/a><\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Director of Nanoscale Research Facility and Assistant Research Scientist, Research Service CentersPhD, University of Florida Research Service Centers | Herbert Wertheim College of Engineering Research Interests: Semiconductor and dielectric growth and characterization, graphene, solid state sensors, focused ion beam processing. Publications: Homepage:<\/p>\n","protected":false},"author":2592,"featured_media":0,"parent":1003,"menu_order":17,"comment_status":"closed","ping_status":"closed","template":"page-templates\/page-section-nav.php","meta":{"_acf_changed":false,"inline_featured_image":false,"featured_post":"","footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-1965","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/pages\/1965","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/users\/2592"}],"replies":[{"embeddable":true,"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/comments?post=1965"}],"version-history":[{"count":2,"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/pages\/1965\/revisions"}],"predecessor-version":[{"id":13247,"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/pages\/1965\/revisions\/13247"}],"up":[{"embeddable":true,"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/pages\/1003"}],"wp:attachment":[{"href":"https:\/\/www.eng.ufl.edu\/nimet\/wp-json\/wp\/v2\/media?parent=1965"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}