Navid Asadi, Ph.D.
Department of Electrical & Computer Engineering
University of Florida
Dr. Navid Asadi is an assistant professor in the Department of Electrical and Computer Engineering at the University of Florida. His research is mainly focused on physical inspection of electronics from device to system level. He investigates novel techniques for electronics counterfeit detection/prevention, system and chip-level reverse engineering, anti-reverse engineering, invasive and semi-invasive physical attacks, integrity analysis, etc. He has received several best paper awards and is the co-founder of the IEEE-PAINE Conference.
Globalization has made the semiconductor industry more susceptible to trust and security issues. Hardware Trojans, i.e., malicious modification to electronic systems, can violate the root of trust when the device or systems are fabricated/assembled in untrusted facilities. As the imaging and failure analysis tools excel in the resolution and capability, physical inspection-based methods become more attractive in verifying such trust issues. On the contrary, such physical inspection methods are opening new capabilities for an adversary to extract sensitive information like secret keys, memory content or intellectual property (IP) compromising confidentiality and integrity. Different countermeasures have been proposed, however, there are still many unanswered questions. This talk will focus on the state-of-the-art physical inspection/assurance methods, the existing countermeasures, related challenges to develop new countermeasures and a research roadmap for this emerging field.
Materials Science & Engineering Dept.